Forwessun has developed the Paperless Repair System for HP3070 In-Circuit Test (ICT) systems. It has been designed to collect board test results for access by remote repair terminals or any network capable device.
The Paperless Repair System provides:
- A Board Test Analysis, retrieved using a unique serial number, detailing all previous tests, including failures and repair activity.
- A graphical display of the location of the failure on the board, along with the test results.
- The ability to share details of repair activities, allowing for the ability to be notified of recommended repair actions for future failures.
- A Test History Analysis showing failure trends.
Test History Analysis