Functional Test
Discover how Forwessun can integrate functional tests into your In-Circuit Test package, offering streamlined solutions
Functional Test Implementation at Forwessun
At Forwessun, we can often integrate functional tests into your In-Circuit Test (ICT) package, saving time and cost by combining testing stages. Before implementing a new functional test strategy, we recommend checking your ICT package for duplicate coverage, as many functional test specifications are designed with bench testing in mind.
Forwessun’s expertise extends across a variety of functional test areas, including:
- Serial Communication: Explore our dedicated Serial Communications page for more information.
- USB Programming: Integrate JTAG or SWD programming (refer to Device Programming for further details).
- EEPROM & Flash Programming: Traceability data can be programmed into SPI, I2C, or 1-wire EEPROM/Flash.
- Unique Serial Numbers: We can read unique serial numbers from 1-wire ID chips.
- BIST Calibration: Functional testing support for Built-In Self-Test calibration.
- Sensing Technologies: Using contact microphones to detect Piezo buzzers and hammer-triggered vibration sensors.
- LED Detection: Complete LED colour detection capabilities.
- MAC Address Generation: We also offer MAC address generation and programming.
By integrating a functional test strategy within your ICT package, Forwessun can streamline the testing process and potentially eliminate the need for costly standalone functional testing.
