Framescan

At Forwessun, we offer Framescan FX, Framescan FX 2.0 and Powered Framescan. Originally developed by Teradyne, the Framescan technique uses a capacitive method that applies an AC signal to a node on an unpowered PCB and measures the voltage coupled to a plate positioned near the component or connector. This method provides a reliable means of testing without requiring existing test library models or test vectors.

The cutting-edge Framescan FX 2.0, Teradyne’s latest generation of vectorless test solutions, designed specifically to detect open pins on component packages and connectors with high percision. 

Framescan FX 2.0 is built with a new low noise amplifier that increases front-end gain, minimizing noise in the measurement circuit. The system also features an improved multiplexer/selector board designed to reject common-mode noise, thereby enhancing the accuracy of pin diagnostics.

The software enhancements in Framescan FX 2.0 include an automatic precision mode, which increases the number of measurement samples for low signals, and a new threshold setting algorithm optimized for higher fault coverage. These improvements help eliminate false positives and false failures, ensuring more accurate test results.

Framescan FX 2.0 is designed for use with Teradyne’s TestStation UltraPin-based in-circuit test systems. It is not compatible with older models such as the GR228X, TS8X, and Z18XX testers. However, existing test programs and fixtures using previous Framescan versions are unaffected by the upgrade. For users looking to take advantage of the new software algorithms available in software version 6.3.0 and later, a simple re-learning process is required to update the measurement limits, which can be done quickly through the Vectorless Test user interface.

For further enhanced test coverage, the Powered Framescan option combines boundary scan technology with Framescan FX hardware. This allows for additional test coverage without requiring direct test access to some nets, offering a versatile solution for complex testing scenarios.

In addition to Framescan FX 2.0, we also support two other vectorless test techniques—Junctions Xpress and DeltaScan—that can enhance test coverage:

• Junctions Xpress: Detects open pins on semiconductor devices by injecting a signal on one pin and measuring its effect on another. This technique is quick to implement and does not require special fixture hardware. However, it is more susceptible to false failures due to its reliance on low-impedance connections.
• DeltaScan: Similar to Junctions Xpress, DeltaScan measures the impact of a signal injected into a semiconductor device to detect open pins. While effective for supplementing coverage, it is also prone to false failures in certain conditions.

These techniques are particularly useful for devices with semiconductor junctions but are not suitable for testing connectors and sockets.